Events with two electrons from 2010
Cite as: McCauley, Thomas; (2014). Events with two electrons from 2010. CERN Open Data Portal. DOI:10.7483/OPENDATA.CMS.PCSW.AHVG
Data recorded in 2010 and published in 2014Dataset Derived Education CMS CERN-LHC
Description
The CMS collaboration has approved the release of 100k dielectron events in the invariant mass range 2-110 GeV for use in outreach and education. This document contains the files for this release.
These data were selected for use in education and outreach and contain a subset of the total event information. The selection criteria may be different from that used in CMS physics results. They are not suitable for a full physics analysis.
Preview
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Dataset characteristics
100000 events.Dataset semantics
| Variable | Type | Description |
|---|---|---|
| Run | The run number of the event. | |
| Event | The event number. | |
| E | The total energy of the electron (GeV). | |
| px,py,pz | The components of the momemtum of the electron (GeV). | |
| pt | The transverse momentum of the electron (GeV). | |
| eta | The pseudorapidity of the electron. | |
| phi | The phi angle of the electron (rad). | |
| Q | The charge of the electron. | |
| M | The invariant mass of two electrons (GeV). |
How were these data selected?
The events in this derived dataset were selected because of the presence of two electrons with invariant mass between 2-110 GeV.
How can you use these data?
Files with the extension .ig are JSON files containing information suitable for visual display. The data can be accessed from the file menu of the online event display. Comma-separated value (csv) files can be used in online applications such as the histogram visualizer and other applications, examples are given in
Jupyter notebooks using CMS Open Data
Files and indexes
Disclaimer
These open data are released under the Creative Commons Zero v1.0 Universal license.
Neither the experiment(s) ( CMS ) nor CERN endorse any works, scientific or otherwise, produced using these data.
This release has a unique DOI that you are requested to cite in any applications or publications.
